NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results

Martha V. O'Bryan; Kenneth A. LaBel; Edward P. Wilcox; Dakai Chen; Edward J. Wyrwas; Michael J. Campola; Megan C. Casey; Jean-Marie Lauenstein; Alyson D. Topper; Carl M. Szabo; Jonathan A. Pellish; Melanie D. Berg; John W. Lewellen; Michael A. Holloway

doi:10.1109/NSREC.2018.8584264

Conference proceeding

NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results

Martha V. O'Bryan, Kenneth A. LaBel, Edward P. Wilcox, Dakai Chen, Edward J. Wyrwas, Michael J. Campola, Megan C. Casey, Jean-Marie Lauenstein, Alyson D. Topper, Carl M. Szabo, …

2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018), pp.1-8

07/2018

DOI: https://doi.org/10.1109/NSREC.2018.8584264

Abstract and subjects

Protons

Schottky diodes

Single event effects

Single event upsets

space radiation reliability

spacecraft electronics

Testing

Voltage measurement

We present the results of single event effects (SEE) testing and analysis investigating the effects of radiation on electronics. This paper is a summary of test results.

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Details

Title: NASA Goddard Space Flight Center's Compendium of Recent Single Event Effects Results
Authors/Creators - name: Martha V. O'Bryan
Kenneth A. LaBel
Edward P. Wilcox
Dakai Chen
Edward J. Wyrwas
Michael J. Campola
Megan C. Casey
Jean-Marie Lauenstein
Alyson D. Topper
Carl M. Szabo
Jonathan A. Pellish
Melanie D. Berg
John W. Lewellen
Michael A. Holloway
Publication Details: 2018 IEEE Nuclear & Space Radiation Effects Conference (NSREC 2018), pp.1-8
Publisher: IEEE
Language: English
Resource Type: Conference proceeding
ISBN: 9781538682647; 1538682648; 153868263X; 9781538682630; 153868263X; 9781538682623; 1538682621; 9781538682630
DOI: https://doi.org/10.1109/NSREC.2018.8584264
Publication ISSN: 2154-0519; 2154-0535