Temperature and Density Measurements of an Optically Thick, Dense Aluminum Plasma Heated by Monochromatic Electrons

J. E Coleman; P Hakel; H. E Morris; C. J Fontes; J Colgan; J. E Koglin; R. M Gilgenbach; R. D McBride; Nicholas Bryan Ramey

doi:10.1109/ICOPS45751.2022.9813026

Conference proceeding

Temperature and Density Measurements of an Optically Thick, Dense Aluminum Plasma Heated by Monochromatic Electrons

J. E Coleman, P Hakel, H. E Morris, C. J Fontes, J Colgan, J. E Koglin, R. M Gilgenbach, R. D McBride and Nicholas Bryan Ramey

The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Conference Proceedings

01/01/2022

DOI: https://doi.org/10.1109/ICOPS45751.2022.9813026

Abstract and subjects

Aluminum

Optical thickness

Radiation transport

Conference Title: 2022 IEEE International Conference on Plasma Science (ICOPS) Conference Start Date: 2022, May 22 Conference End Date: 2022, May 26 Conference Location: Seattle, WA, USA4x10 17 cm -3 and electron temperatures around 1 eV. Initial atomic kinetics calculations are presented to threshold plasma temperatures based on the Al-I line profiles. A spectroscopic-quality radiation transport model is developed to post-process results of a radiation-hydrodynamics simulation of the energy deposition and subsequent hydrodynamic expansion of the plasma, including estimating the optical depth of the Al-I lines.

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Title: Temperature and Density Measurements of an Optically Thick, Dense Aluminum Plasma Heated by Monochromatic Electrons
Authors/Creators - name: J. E Coleman
P Hakel
H. E Morris
C. J Fontes
J Colgan
J. E Koglin
R. M Gilgenbach
R. D McBride
Nicholas Bryan Ramey
Publication Details: The Institute of Electrical and Electronics Engineers, Inc. (IEEE) Conference Proceedings
Publisher: The Institute of Electrical and Electronics Engineers, Inc. (IEEE)
Language: English
Resource Type: Conference proceeding
DOI: https://doi.org/10.1109/ICOPS45751.2022.9813026