Characterization of an active metasurface using terahertz ellipsometry
Journal article   Peer reviewed

Characterization of an active metasurface using terahertz ellipsometry

Nicholas Karl, Martin S. Heimbeck, Henry O. Everitt, Hou-Tong Chen, Antoinette J. Taylor, Igal Brener, Alexander Benz, John L. Reno, Rajind Mendis, Daniel M. Mittleman, …
Applied physics letters, Vol.111(19), p.191101
11/06/2017

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Physical Sciences Physics Physics, Applied Science & Technology

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