Morphology and water resistance of mixed silane films of bis[3-(triethoxysilyl) propyl]tetrasulfide and bis-[trimethoxysilylpropyl]amine
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Morphology and water resistance of mixed silane films of bis[3-(triethoxysilyl) propyl]tetrasulfide and bis-[trimethoxysilylpropyl]amine

Guirong Pan, Dale W. Schaefer, Wim J. van Ooij, Michael S. Kent, Jaroslaw Majewski, Hyun Yim and Argonne National Lab. (ANL), Argonne, IL (United States). Advanced Photon Source (APS)
Thin solid films, Vol.515(4), pp.2771-2780
12/05/2006

Abstract and subjects

Interface Neutron reflectivity Silanes Swelling

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